Modular MPI Component Testing Facility

Abstract

The image quality of magnetic particle imaging depends on the interference-free measurement of the particle
spectrum. Systematic errors due to harmonic distortions in the components used for implementation complicate
the development of efficient imaging devices. To test the suitability of parts for the development of MPI
scanners, a test bench was developed in which the components to be tested can be integrated, to evaluate their
suitability using the measured spectrum. Different forms of connectors integrated into the high-current path
were analyzed for their influence on the signal quality using this test bench. An evaluation of this components
can be made from the clearly visibible distortions in the spectrum recorded with the high-sensitive test system.